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	1.	Machine vision inspection systems. Volume 2, Machine -learning-based approaches / edited by Muthukumaran Malarvel, Soumya Ranjan Nayak, Prasant Kumar Pattnaik and Surya Narayan Panda. by Malarvel, Muthukumaran [editor.] Nayak, Soumya Ranjan, 1984- [editor.] Pattnaik, Prasant Kumar, 1969- [editor.] Panda, Sury Narayan [editor.] Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Beverly, MA : Scrivener Publishing, 2021 Other title: Machine -learning-based approaches Online access: Click here to access online Availability: No items available. Add to cart (remove)
	2.	Machine vision inspection systems. Volume 1, Image Processing, Concepts, Methodologies and Applications / edited by Muthukumaran Malarvel, Soumya Ranjan Nayak, Sury Narayan Panda, Prasant Kumar Pattnaik and Nittaya Muangnak. by Malarvel, Muthukumaran [editor.] Nayak, Soumya Ranjan, 1984- [editor.] Panda, Sury Narayan [editor.] Pattnaik, Prasant Kumar, 1969- [editor.] Muangnak, Nittaya [editor.] Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Hoboken, NJ : Wiley-Scrivener, 2020 Other title: Image Processing, Concepts, Methodologies and Applications Online access: Click here to access online Availability: No items available. Add to cart (remove)
	3.	Digital holography / Pascal Picart, Jun-chang Li. by Picart, Pascal Li, Junchang, 1945- Series: ISTE Material type: Text; Format: available online ; Literary form: Not fiction Publication details: London : Hoboken, NJ : ISTE ; Wiley, 2012 Online access: Click here to access online Availability: No items available. Add to cart (remove)

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