Machine vision inspection systems. Volume 1, Image Processing, Concepts, Methodologies and Applications / edited by Muthukumaran Malarvel, Soumya Ranjan Nayak, Sury Narayan Panda, Prasant Kumar Pattnaik and Nittaya Muangnak.
Material type:
TextPublisher: Hoboken, NJ : Wiley-Scrivener, 2020Description: 1 online resourceContent type: - text
- computer
- online resource
- 9781119682042
- 1119682045
- Image Processing, Concepts, Methodologies and Applications
- Computer vision
- Computer vision -- Industrial applications
- Engineering inspection -- Automation
- Image processing
- Image processing -- Digital techniques
- Vision par ordinateur
- Vision par ordinateur -- Applications industrielles
- Contr�ole technique -- Automatisation
- Traitement d'images
- Traitement d'images -- Techniques num�eriques
- image processing
- digital imaging
- Computer vision
- Computer vision -- Industrial applications
- Engineering inspection -- Automation
- Image processing
- Image processing -- Digital techniques
- 006.3/7 23
- TA1634 .M3354 2020eb
Includes bibliographical references and index.
"Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes the image processing, machine vision and pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Recently, the current automated vision research on machine inspection has gained more popularity with researchers and engineers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examinations during the inspection process, leading to potential disaster. Machine Vision Inspection Systems (MVIS) is better able to avoid false assessment"-- Provided by publisher
Print version record.
John Wiley and Sons Wiley Online Library: Complete oBooks
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